Non-Contacting Video Extensometer
The second generation Advanced Video Extensometer (AVE 2) utilizes patented measurement technology in the fastest, most accurate non-contacting strain measurement device commercially available. The fully-integrated device easily adapts to the normal fluctuations of environmental conditions in your lab and is easily adapted to any testing machine on the market. The device dramatically reduces errors from thermal and lighting variations that are common in most labs, and conforms to the most rigorous testing standards, including ISO 527-2, ASTM D638, ISO 6892-1, and ASTM E8.
Request a Quote View Specifications
SAME RESULTS IN ANY LAB
Designed to Reduce Operator and Environmental Influences
Eliminates the effect of operators on your strain results; producing more consistent and repeatable results. Prevents premature damage to the specimen by measuring strain without touching for the most accurate results.
No two labs have the same lighting conditions, and lighting can change throughout the day, which can lead to different results. To ensure the AVE 2 always sees the same image, Instron uses a patented cross-polarized lighting system (US 7,047,819 B2, EP 1,424,547, B1) that’s able to produce repeatable results regardless of your lab’s lighting conditions.
Normal laboratory ventilation creates air flows which diffract light, introducing errors that can be as high as several microns. The AVE 2 uses patented CDAT fans (US 7,610,815 B2, and EP 1,424,547, B1) which create a constant air-flow between the specimen and the camera, producing consistent results even if your air conditioner turns on during a test.
One Device to Meet All Your Strain Measurement Needs
AVE 2 lets you measure modulus and strain properties to failure, including r&n results with the transverse option, at high, low, or ambient conditions on almost any material including plastics, metals, composites, textiles, films, elastomers, paper, components, and bio-materials.
Designed to Move from System to System with Ease
COMPATIBLE WITH DYNAMIC SYSTEMS
For Cyclic Testing and High Speed Monotonic Tests